Peter DeWolf: search on Z-Library

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1

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Optical coherence tomography with a Fizeau interferometer configuration

Casaubieilh, P., Ottevaere, Heidi, DeWolf, Peter, Ford, H. D., James, S. W., Wiersma, Diederik S., Tatam, R. P.

Year:

2005

Language:

english

File:

PDF, 147 KB

english, 2005

2

Translation procedures for standardised quality of life questionnaires: The European Organisation for Research and Treatment of Cancer (EORTC) approach

Michael Koller, Neil K. Aaronson, Jane Blazeby, Andrew Bottomley, Linda Dewolf, Peter Fayers, Colin Johnson, John Ramage, Neil Scott, Karen West

Journal:

European Journal of Cancer

Year:

2007

Language:

english

File:

PDF, 265 KB

english, 2007

3

Appraised changeability of a stressor as a modifier of the relationship between coping and depression: A test of the hypothesis of fit.

Vitaliano, Peter P., DeWolfe, Deborah J., Maiuro, Roland D., Russo, Joan, Katon, Wayne

Journal:

Journal of Personality and Social Psychology

Year:

1990

Language:

english

File:

PDF, 1.33 MB

english, 1990

4

Seroepidemiology of hepatitis E virus in the Egyptian Nile Delta

Moamena A. Kamel, Hugo Troonen, Hans-Peter Kapprell, Ahmed El-Ayady, F. Dewolfe Miller

Journal:

Journal of Medical Virology

Year:

1995

Language:

english

File:

PDF, 577 KB

english, 1995

5

Teratocarcinoma: Basic research and its clinical relevance

Perinchery Narayan, Peter G. Carroll, William C. DeWolf

Journal:

World Journal of Urology

Year:

1984

Language:

english

File:

PDF, 689 KB

english, 1984

6

Trace-element fractionation in plumes and the origin of HIMU mantle beneath the Cameroon line

Halliday, Alex N., Davidson, Jon P., Holden, Peter, DeWolf, Charles, Lee, Der-Chuen, Fitton, J. Godfrey

Journal:

Year:

1990

File:

PDF, 642 KB

1990

7

Salt water infiltration in two artificial sea inlets in the Belgian dune area

A. Vandenbohede, L. Lebbe, Stefaan Gysens, Kevin Delecluyse, Peter DeWolf

Journal:

Journal of Hydrology

Year:

2008

Language:

english

File:

PDF, 1.80 MB

english, 2008

8

Inhibition of ganglioside sialyltransferase activity and stimulation of neutral glycolipid exocytosis by heparin

Gerald A. Schwarting, Anna Gajewski, Peter Carroll, William C. Dewolf

Journal:

Archives of Biochemistry and Biophysics

Year:

1987

Language:

english

File:

PDF, 2.05 MB

english, 1987

9

Fucosyl-globoside and sialosyl-globoside are new glycolipids isolated from human teratocarcinoma cells

Gerald A. Schwarting, Peter G. Carroll, William C. DeWolf

Journal:

Biochemical and Biophysical Research Communications

Year:

1983

Language:

english

File:

PDF, 1.98 MB

english, 1983

10

Expanded Prostate Cancer Index Composite for Clinical Practice: Development and Validation of a Practical Health Related Quality of Life Instrument for Use in the Routine Clinical Care of Patients With Prostate Cancer

Chang, Peter, Szymanski, Konrad M., Dunn, Rodney L., Chipman, Jonathan J., Litwin, Mark S., Nguyen, Paul L., Sweeney, Christopher J., Cook, Robert, Wagner, Andrew A., DeWolf, William C., Bubley, Glenn

Journal:

The Journal of Urology

Year:

2011

Language:

english

File:

PDF, 214 KB

english, 2011

11

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Mapping of surface refractive-index distribution by reflection SNOM

Radko, Ilya P., Volkov, Valentyn S., Bozhevolnyi, Sergey I., Henningsen, Jes, Pedersen, Jens, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 794 KB

english, 2005

12

Prediction of solvent dependent β-roll formation of a self-assembling silk-like protein domain

Schor, Marieke, Martens, Aernout A., deWolf, Frits A., Cohen Stuart, Martien A., Bolhuis, Peter G.

Journal:

Year:

2009

Language:

english

File:

PDF, 1.25 MB

english, 2009

13

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Analytical model of a double grating system with partial temporal and spatial coherence

Sanchez-Brea, Luis Miguel, Alonso, Jose, Saez-Landete, Jose Bienvenido, Bernabeu, Eusebio, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 593 KB

english, 2005

14

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Full-field optical coherence tomography

Ford, H. D., Tatam, R. P., Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 610 KB

english, 2005

15

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Two-dimensional power spectral density measurements of x-ray optics with the Micromap interferometric microscope

Yashchuk, Valeriy V., Franck, Andrew D., Irick, Steve C., Howells, Malcolm R., MacDowell, Alastair A., McKinney, Wayne R., Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 3.19 MB

english, 2005

16

Justice Oliver Wendell Holmes

Magrath, C. Peter, Howe, Mark DeWolfe

Journal:

The Mississippi Valley Historical Review

Year:

1963

Language:

english

File:

PDF, 318 KB

english, 1963

17

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Optimisation of Low-Coherence Speckle Interferometry (LCSI) for characterisation of multi-layered materials

Gastinger, Kay, Winther, Svein, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 614 KB

english, 2005

18

[ACM Press the 7th International Conference - Seoul, Korea (2012.09.11-2012.09.12)] Proceedings of the 7th International Conference on Future Internet Technologies - CFI '12 - Developing a RINA prototype over UDP/IP using TINOS

Grasa, Eduard, Trouva, Eleni, Bunch, Steve, DeWolf, Peter, Day, John

Year:

2012

Language:

english

File:

PDF, 1.20 MB

english, 2012

19

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - International standards for metrology of microlens arrays

Miyashita, Takaaki, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 895 KB

english, 2005

20

Antigen-Driven CD4+ T Cell and HIV-1 Dynamics: Residual Viral Replication under Highly Active Antiretroviral Therapy

Neil M. Ferguson, Frank deWolf, Azra C. Ghani, Christophe Fraser, Christl A. Donnelly, Peter Reiss, Joep M. A. Lange, Sven A. Danner, Geoff P. Garnett, Jaap Goudsmit and Roy M. Anderson

Journal:

Proceedings of the National Academy of Sciences

Year:

1999

Language:

english

File:

PDF, 1.78 MB

english, 1999

21

Gleason Misclassification Rate is Independent of Number of Biopsy Cores in Systematic Biopsy

Quintana, Liza, Ward, Ashley, Gerrin, Sean J., Genega, Elizabeth, Rosen, Seymour, Sanda, Martin G., Wagner, Andrew A., Chang, Peter, DeWolf, William C., Ye, Huihui

Journal:

Year:

2016

Language:

english

File:

PDF, 819 KB

english, 2016

22

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Comparison of different approaches for modelling microscope images on the basis of rigorous diffraction calculation

Bodermann, Bernd, Ottevaere, Heidi, DeWolf, Peter, Ehret, Gerd, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 203 KB

english, 2005

23

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Application of the microinterferometric tomography setup to the reliability tests of the fiber sensors exposed to cumulated gamma radiation

Kniazewski, Pawel, Ottevaere, Heidi, DeWolf, Peter, Kujawinska, Malgorzata, Berghmans, Francis, Wiersma, Diederik S., Fernandez, Alberto, Goussarov, Andrei, Van Uffelen, Marco

Year:

2005

Language:

english

File:

PDF, 616 KB

english, 2005

24

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Effect of the refraction index in the diameter estimation of thin metallic wires

Sanchez-Brea, Luis Miguel, Ottevaere, Heidi, DeWolf, Peter, Martinez-Anton, Juan Carlos, Bernabeu, Eusebio, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 358 KB

english, 2005

25

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Investigation of thermal expansion homogeneity by optical interferometry

Schodel, R., Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 834 KB

english, 2005

26

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Displacement metrology based on grating imaging with a cylindrical lens array and a phase grating

Oka, Toru, Ottevaere, Heidi, DeWolf, Peter, Ohmura, Yoichi, Nakashima, Toshiro, Wiersma, Diederik S., Gao, Wei, Hane, Kazuhiro, Kiyono, Satoshi

Year:

2005

Language:

english

File:

PDF, 173 KB

english, 2005

27

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Two methods to determine topological charge in regular net of optical vortices

Fraczek, Ewa, Ottevaere, Heidi, DeWolf, Peter, Fraczek, Wojciech, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 1.08 MB

english, 2005

28

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Biological specimens analysis using dynamic speckle spectral bands

Sendra, G. H., Ottevaere, Heidi, DeWolf, Peter, Salerno, J. C., Weber, C., Wiersma, Diederik S., Rabal, H. J., Arizaga, R., Trivi, M.

Year:

2005

Language:

english

File:

PDF, 418 KB

english, 2005

29

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - High accuracy optoelectronic control system for near field characterization of millimeter long wave guiding structures

Chassagne, L., Ottevaere, Heidi, DeWolf, Peter, Topcu, S., Alayli, Y., Wiersma, Diederik S., Juncar, P., Lerondel, G., Blaize, S., Bruyant, A., Stefanon, I., Royer, P.

Year:

2005

Language:

english

File:

PDF, 248 KB

english, 2005

30

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Sub-0.1 μm optical track width measurement

Smith, Richard J., Ottevaere, Heidi, DeWolf, Peter, See, Chung W., Somekh, Mike G., Wiersma, Diederik S., Yacoot, Andrew

Year:

2005

Language:

english

File:

PDF, 165 KB

english, 2005

31

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Elimination of 'ghost'-effect-related systematic errors in metrology of x-ray optics with a long trace profiler

Yashchuk, Valeriy V., Ottevaere, Heidi, DeWolf, Peter, Irick, Steve C., MacDowell, Alastair A., Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 1.36 MB

english, 2005

32

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Portable interference device for roughness measurement

Angelsky, Oleg V., Ottevaere, Heidi, DeWolf, Peter, Maksimyak, Peter P., Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 476 KB

english, 2005

33

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Investigation and evaluation of scatterometric CD metrology methods

Wurm, Matthias, Ottevaere, Heidi, DeWolf, Peter, Bodermann, Bernd, Mirande, Werner, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 346 KB

english, 2005

34

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Uncertainty analysis for phase measurement on PSM with a 193nm common-path shearing interferometer

Fuetterer, G., Ottevaere, Heidi, DeWolf, Peter, Schwider, J., Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 1.03 MB

english, 2005

35

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Testing a new method for small-angle rotation measurements

Popiolek-Masajada, A., Ottevaere, Heidi, DeWolf, Peter, Borwinska, M., Dubik, B., Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 829 KB

english, 2005

36

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - High accuracy reflectometry technique and statistical measurements treatment method for refraction index determination

Pozo Ayuso, Diego F., Ottevaere, Heidi, DeWolf, Peter, Garcia Granda, Miguel, Fernandez Fernandez, Susana, Wiersma, Diederik S., Rodriguez Garcia, Jose

Year:

2005

Language:

english

File:

PDF, 706 KB

english, 2005

37

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Automated fringe-pattern extrapolation for patterned surface profiling by interference microscopy with Fourier transform analysis

Breluzeau, Cedric, Ottevaere, Heidi, DeWolf, Peter, Bosseboeuf, Alain, Petitgrand, Sylvain, Wiersma, Diederik S., Leroux, Xavier

Year:

2005

Language:

english

File:

PDF, 499 KB

english, 2005

38

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Optimum instrumentation of a tapping mode, non-optically regulated near-field scanning optical microscope and its applications

Lu, Nien Hua, Ottevaere, Heidi, DeWolf, Peter, Chang, Yu Min, Tsai, Din Ping, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 437 KB

english, 2005

39

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Interferometric method for measuring the refractive index profile of optical waveguides directly written in glass substrates by femtosecond laser

Ferraro, P., Ottevaere, Heidi, DeWolf, Peter, Aiello, L., De Nicola, S., Wiersma, Diederik S., Finizio, A., Osellame, R., Chiodo, N., Maselli, V., Cerullo, G., Laporta, P.

Year:

2005

Language:

english

File:

PDF, 1.14 MB

english, 2005

40

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Non-destructive optical system based on digital holographic microscope for quasi real-time characterization of micromechanical shunt switch

Striano, Valerio, Ottevaere, Heidi, DeWolf, Peter, Coppola, Giuseppe, Ferraro, Pietro, Wiersma, Diederik S., Alfieri, Domenico, De Nicola, Sergio, Finizio, Andrea, Pierattini, Giovanni, Marcelli, Romo

Year:

2005

Language:

english

File:

PDF, 448 KB

english, 2005

41

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Compact laser scanning confocal microscope

Beghuin, D., Ottevaere, Heidi, DeWolf, Peter, vandeVen, M., Ameloot, M., Wiersma, Diederik S., Claessens, D., Van Oostveldt, P.

Year:

2005

Language:

english

File:

PDF, 1.64 MB

english, 2005

42

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Influence of the real-life structures in optical metrology using spectroscopic scatterometry analysis

Quintanilha, R., Ottevaere, Heidi, DeWolf, Peter, Hazart, J., Thony, P., Wiersma, Diederik S., Henry, D.

Year:

2005

Language:

english

File:

PDF, 752 KB

english, 2005

43

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Micro-optic measurement techniques and instrumentation in the European Network of Excellence for Micro-Optics (NEMO)

Kujawinska, Malgorzata, Ottevaere, Heidi, DeWolf, Peter, Gorecki, Christophe, Ottevaere, Heidi, Wiersma, Diederik S., Szczepanski, Pawel, Thienpont, Hugo

Year:

2005

Language:

english

File:

PDF, 770 KB

english, 2005

44

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Absolute distance measurement using femtosecond laser

Kim, Seung-Woo, Ottevaere, Heidi, DeWolf, Peter, Joo, Ki-Nam, Jin, Jonghan, Wiersma, Diederik S., Kim, Yun Seok

Year:

2005

Language:

english

File:

PDF, 277 KB

english, 2005

45

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Comparison of methods for the determination of the aperture correction of interference microscopes

Kruger-Sehm, Rolf, Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 557 KB

english, 2005

46

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Characterization and engineering of ferroelectric microstructures by interferometric methods

Grilli, S., Ottevaere, Heidi, DeWolf, Peter, Ferraro, P., Paturzo, M., Wiersma, Diederik S., Alfieri, D., De Natale, P., de Angelis, M., De Nicola, S., Finizio, A., Pierattini, G.

Year:

2005

Language:

english

File:

PDF, 2.16 MB

english, 2005

47

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Airy-like internal reflection series applied in scatterometry and simulations of gratings

Antos, Roman, Ottevaere, Heidi, DeWolf, Peter, Mistrik, Jan, Yamaguchi, Tomuo, Wiersma, Diederik S., Horie, Masahiro, Visnovsky, Stefan

Year:

2005

Language:

english

File:

PDF, 316 KB

english, 2005

48

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Real-time in situ sag characterization of microlenses fabricated with Deep Lithography with Protons

Gomez, Virginia, Ottevaere, Heidi, DeWolf, Peter, Ottevaere, Heidi, Volckaerts, Bart, Wiersma, Diederik S., Thienpont, Hugo

Year:

2005

Language:

english

File:

PDF, 1.60 MB

english, 2005

49

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Polarimetry: measurements, error analysis, and application

Flueraru, C., Ottevaere, Heidi, DeWolf, Peter, Cai, X., Chang, S., Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 163 KB

english, 2005

50

SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Nano- and Micro-Metrology - Measurement advances for micro-refractive fabrication

Gardner, Neil, Ottevaere, Heidi, DeWolf, Peter, Davies, Angela, Bergner, Brent, Wiersma, Diederik S.

Year:

2005

Language:

english

File:

PDF, 727 KB

english, 2005

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